Permittivity Measuring Technique Based on a Parallel-Plate Waveguide Concept

Conventionally, techniques based on micro strip and rectangular wave guides have been utilized for determining the permittivity of materials, however these techniques require elaborated procedures due to quasi-Transversal Electromagnetic mode (quasi-TEM) and Transversal Electric/Transversal Magnetic (TE/TM) propagation modes. In this paper, a new technique based on a parallel-plate wave guide concept is presented. The advantage of using this type of wave guide is that a TEM propagation mode can be established. This can make the extraction of the permittivity value straightforward as is shown in this paper. The proposed technique is validated by measuring a known dielectric material, and a good agreement between the measured and reported values is observed.