Title :
Ultra-high speed memory bus using microwave interconnects
Author :
Aberle, James T. ; Bensalem, Brahim
Author_Institution :
Sch. of ECEE, Arizona State Univ., Tempe, AZ, USA
Abstract :
A new memory bus concept that has the potential to dramatically improve double data rate (DDR) memory speed is presented. The memory signal is modulated onto an RF carrier which is routed using substrate integrated waveguide (SIW) interconnect technology. The channel is divided into multi-carrier bands where each symbol is modulated onto one carrier using 64-QAM format. The conventional DDR bus is entirely mapped into the proposed multi-carrier memory channel architecture (MCMCA). At the receiver the signal is demodulated and then delivered to SDRAM devices. Experimental characterization of the new channel shows that by using judicious frequency division multiplexing, as few as one SIW is sufficient to transmit the 64 DDR bits. Overall aggregated bus data rate achieves 30 Gbps data transfer with error vector magnitude (EVM) not exceeding 2.26% and phase error of 1.07 degree or less.
Keywords :
DRAM chips; SRAM chips; frequency division multiplexing; high-speed integrated circuits; interconnections; memory architecture; microwave devices; quadrature amplitude modulation; substrate integrated waveguides; 64-QAM format; DDR bus; DDR memory speed; EVM; MCMCA; RF carrier; SDRAM devices; SIW interconnect technology; bit rate 30 Gbit/s; double data rate memory speed; error vector magnitude; judicious frequency division multiplexing; memory signal; microwave interconnects; multicarrier bands; multicarrier memory channel architecture; storage capacity 64 bit; substrate integrated waveguide; ultrahigh speed memory bus; Bandwidth; Clocks; Delay; Dispersion; Frequency division multiplexing; Frequency modulation; Optical waveguides; DDR Memory; Memory Wall; SIW; Signal Integrity;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2012 IEEE 21st Conference on
Conference_Location :
Tempe, AZ
Print_ISBN :
978-1-4673-2539-4
Electronic_ISBN :
978-1-4673-2537-0
DOI :
10.1109/EPEPS.2012.6457830