DocumentCode :
594041
Title :
Challenges in extending single-ended graphics memory data rates
Author :
Mukherjee, Sayan ; Dan Oh ; Vaidyanath, Arun ; Dressler, Deborah ; Sendhil, A.
Author_Institution :
Rambus Inc., Sunnyvale, CA, USA
fYear :
2012
fDate :
21-24 Oct. 2012
Firstpage :
39
Lastpage :
42
Abstract :
While the need for higher graphics memory bandwidth continues to grow, it is evident that owing to the multitude of challenges in single ended signaling, pushing data rates beyond 6 Gbps is exceedingly difficult. To isolate, quantify and combat the most important factors that limit the performance of modern high speed single ended systems, a high speed GDDR5 memory system (link width: ×32) has been designed using a Rambus prototype test-chip (TSMC 40 nm process node) and a leading single ended signaling graphics GDDR5 DRAM. Critical challenges faced in scaling the data rates up to 8 Gbps are presented and the varying impact of these challenges on the system margin is shown for increasing speeds. An example of a chip-to-chip system between two prototype test chips, that mitigates these performance limiting determinants, is shown to operate robustly at data rates beyond 8 Gbps. The ingredients of this system are likely techniques for the future graphics memories.
Keywords :
DRAM chips; GDDR5 memory system; Rambus prototype test-chip; TSMC process node; bit rate 6 Gbit/s; chip-to-chip system; modern high speed single ended systems; single ended signaling graphics GDDR5 DRAM; single-ended graphic memory data rates; size 40 nm; Bit error rate; Crosstalk; Graphics; Limiting; Noise; Prototypes; Random access memory; BER; Graphics; ISI; Memory; POD I/O; SSO; VREF; single-ended;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2012 IEEE 21st Conference on
Conference_Location :
Tempe, AZ
Print_ISBN :
978-1-4673-2539-4
Electronic_ISBN :
978-1-4673-2537-0
Type :
conf
DOI :
10.1109/EPEPS.2012.6457838
Filename :
6457838
Link To Document :
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