Title :
A statistical assessment of opto-electronic links
Author :
Manfredi, Paolo ; Stievano, Igor Simone ; Perrone, G. ; Bardella, Paolo ; Canavero, Flavio G.
Author_Institution :
DET - Dept. of Electron. & Telecommun., Politec. di Torino, Turin, Italy
Abstract :
This paper addresses the stochastic simulation of high-speed optical interconnects. It provides an effective solution for the inclusion of the effects of process variation or possible unknown device characteristics on the system response. The proposed approach is based on the stochastic collocation method and Lagrange interpolation. The results obtained on the transient analysis of a realistic on-board optical link with uncertain parameters conclude the paper.
Keywords :
interpolation; optical interconnections; optical links; optoelectronic devices; statistical analysis; stochastic processes; Lagrange interpolation; high-speed optical interconnects; on-board optical link; opto-electronic links; statistical assessment; stochastic collocation; stochastic simulation; Interpolation; Mathematical model; Optical interconnections; Polynomials; Random variables; Stochastic processes; Circuit modeling; circuit simulation; optical interconnects; stochastic analysis; stochastic collocation; tolerance analysis; uncertainty;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2012 IEEE 21st Conference on
Conference_Location :
Tempe, AZ
Print_ISBN :
978-1-4673-2539-4
Electronic_ISBN :
978-1-4673-2537-0
DOI :
10.1109/EPEPS.2012.6457843