Title :
Characterizing the impact of conductor surface roughness on CB-CPW behavior via reduced computational complexity
Author :
Sain, A. ; Melde, Kathleen L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Arizona, Tucson, AZ, USA
Abstract :
This paper presents a way to include the effects of conductor surface roughness in three-dimensional full wave simulation tools. A comparison of the computational load and attenuation coefficient as a function of the number and area of different surfaces roughened is given.
Keywords :
computational complexity; conductors (electric); coplanar waveguides; surface roughness; CB-CPW behavior; attenuation coefficient; computational complexity reduction; computational load; conductor backed coplanar waveguide; conductor surface roughness impact; three-dimensional full wave simulation tools; Attenuation; Computational modeling; Conductors; Rough surfaces; Surface impedance; Surface roughness; Surface waves; autocorrelation function (ACF); conductor backed coplanar waveguide (CB-CPW); conductor loss; interconnect; root mean square height (Hrms); surface roughness; transmission lines;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2012 IEEE 21st Conference on
Conference_Location :
Tempe, AZ
Print_ISBN :
978-1-4673-2539-4
Electronic_ISBN :
978-1-4673-2537-0
DOI :
10.1109/EPEPS.2012.6457891
