Title :
Fabrication of F-ion implanted quantum well intermixed waveguide grating
Author :
Sonkar, R.K. ; Das, Udhab
Author_Institution :
Dept. of Electron. & Electr. Eng., Indian Inst. of Technol. Guwahati, Guwahati, India
Abstract :
This paper reports the ion implantation induced quantum well intermixing used to fabricate waveguide gratings for applications at CWDM wavelengths on InGaAsP/InP multi quantum well structure. The waveguide is fabricated using reactive ion etching (methane chemistry) with a surface roughness 2~3nm. Focused ion beam is used to open windows for fluorine implantation on titanium mask followed by anneal under forming gas environment. The transmission spectrum of the waveguide has been measured and found cross talks of -10dB among the adjacent channels. The insertion loss of the fabricated waveguide gratings is less than 5dB.
Keywords :
III-V semiconductors; annealing; diffraction gratings; fluorine; focused ion beam technology; gallium arsenide; gallium compounds; indium compounds; ion implantation; light transmission; optical crosstalk; optical fabrication; optical losses; optical waveguides; quantum well devices; semiconductor quantum wells; sputter etching; surface roughness; wavelength division multiplexing; CWDM wavelengths; InGaAsP-InP:F; annealing; coarse wavelength division multiplexing; fluorine-ion implanted quantum well intermixed waveguide grating; focused ion beam; forming gas environment; insertion loss; ion implantation; methane chemistry; optical crosstalk; optical fabrication; reactive ion etching; surface roughness; titanium mask; transmission spectrum; Gratings; Impurities; Quantum wells; Rough surfaces; Surface roughness; Surface waves; grating; insertion loss; intermixing; quantum well; waveguide;
Conference_Titel :
Photonics Global Conference (PGC), 2012
Conference_Location :
Singapore
Print_ISBN :
978-1-4673-2513-4
DOI :
10.1109/PGC.2012.6458096