Title :
Bit-error rate analysis of integrated optoelectronic receiver
Author :
Youn, J.-S. ; Lee, Myung-Jae ; Park, K.-Y. ; Choi, Won-Yong ; Rucker, Holger
Author_Institution :
Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea
Abstract :
In this paper, we investigate a bit-error rate (BER) of an optoelectronic integrated circuit (OEIC) receiver. For this investigation, signal and noise characteristics of a Si avalanche photodetector and a high-speed electronic circuit are analyzed. Using the fabricated OEIC receiver, 12.5-Gb/s 231-1 pseudo-random binary sequence optical signal is successfully detected with BER less than 10-12 at incident optical power of -7 dBm.
Keywords :
binary sequences; elemental semiconductors; error statistics; integrated optoelectronics; optical fabrication; optical receivers; optical signal detection; photodetectors; silicon; BER; OEIC receiver; Si; bit rate 12.5 Gbit/s; bit-error rate analysis; high-speed electronic circuit; integrated optoelectronic receiver; noise characteristics; optical fabrication; pseudorandom binary sequence optical signal detection; signal characteristics; silicon avalanche photodetector; Bit error rate; Equalizers; Limiting; Receivers; Semiconductor device measurement; Signal to noise ratio; Silicon; Bit-error rate; Si avalanche photodetector; optoelectronic integrated circuit;
Conference_Titel :
Photonics Global Conference (PGC), 2012
Conference_Location :
Singapore
Print_ISBN :
978-1-4673-2513-4
DOI :
10.1109/PGC.2012.6458111
