DocumentCode :
594429
Title :
Embedded IC module package using silicon substrate
Author :
Jong-Min Yook ; Jun Chul Kim ; Dongsu Kim ; Jong-Chul Park
Author_Institution :
Packaging Res. Centre, Korea Electron. Technol. Inst., Seongnam, South Korea
fYear :
2012
fDate :
Oct. 29 2012-Nov. 1 2012
Firstpage :
999
Lastpage :
1002
Abstract :
In this paper, an embedded passive and active package is developed by using silicon substrates. Embedded passives are integrated on the silicon substrate by using standard thin-film processes, and active devices are embedded in the silicon using cavity structures. An organic lamination process is used for filling the gap between IC and silicon. Signal vias are realized by using UV laser drilling. To demonstrate the process technology, three active ICs, a SPDT, SP3T switch and a LNA, are embedded in the silicon cavity depth of 160 μm and thin film MIM capacitors and spiral inductors for DC blocking or impedance matching are integrated in the substrate. The size of implemented switch LNA module is only 3.8×1.7×0.22 mm3. The measured insertion loss of the SPDT and SP3T switch was 0.49 dB and 0.8 dB at 2.45 GHz respectively and its application frequency of the SPDT switch is improved by 6 GHz due to low parasitic effect. The gain of the switch LNA module is 24 dB at the pass band.
Keywords :
MMIC amplifiers; drilling; elemental semiconductors; impedance matching; inductors; integrated circuit packaging; laminations; low noise amplifiers; microwave switches; semiconductor thin films; silicon; thin film capacitors; DC blocking; SP3T switch; SPDT; Si; UV laser drilling; active IC; active devices; active package; cavity structures; embedded IC module package; embedded passive package; frequency 2.45 GHz; frequency 6 GHz; gain 24 dB; impedance matching; loss 0.49 dB; loss 0.8 dB; low parasitic effect; measured insertion loss; organic lamination process; signal vias; silicon substrate; spiral inductors; standard thin-film processes; switch LNA module; thin film MIM capacitors; Cavity resonators; Integrated circuits; Lamination; MIM capacitors; Silicon; Substrates; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference (EuMC), 2012 42nd European
Conference_Location :
Amsterdam
Print_ISBN :
978-1-4673-2215-7
Electronic_ISBN :
978-2-87487-026-2
Type :
conf
Filename :
6459213
Link To Document :
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