Title :
A novel tunable matching network for dynamic load modulation of high power amplifiers
Author :
Li Yue ; Maehata, Takashi ; Totani, K. ; Tango, H. ; Hashinaga, T. ; Asaina, T.
Author_Institution :
Inf. & Commun. Labs., Sumitomo Electr. Ind., Osaka, Japan
fDate :
Oct. 29 2012-Nov. 1 2012
Abstract :
Dynamic load modulation (DLM) has been proposed as a promising technique to improve the backoff efficiency of power amplifier (PA) for wireless communication systems with high peak-to-average power ratio (PAPR), where the design of a tunable matching network (TMN) with wide impedance tuning range and low loss is essential. This work proposes a novel TMN circuit topology that has three main features satisfying closely to the requirements of DLM: able to generate impedance trajectory close to the pure resistance, easy to produce impedance trajectory of a wide tuning range, e.g., with reflection coefficient Γcoverage up to 0.9, and possessing high potential to generate a TMN having low loss especially at high Γ. A TMN circuit for load modulation of 2.14GHz Class-B GaN HEMT PAs based on the proposed topology is built and measured. Static measurements show that, given a properly selected PA, the drain efficiency is improved by 30% at 7.5dB backoff by the load modulation.
Keywords :
III-V semiconductors; UHF field effect transistors; UHF power amplifiers; gallium compounds; high electron mobility transistors; impedance matching; wide band gap semiconductors; PAPR; TMN circuit topology; class-B HEMT PA; dynamic load modulation; efficiency 30 percent; frequency 2.14 GHz; high peak-to-average power ratio; high power amplifiers; impedance trajectory; impedance tuning range; reflection coefficient; tunable matching network; wireless communication systems; Circuit topology; Gallium nitride; Impedance; Modulation; Shunts (electrical); Trajectory; Tuning; DLM; backoff; drain efficiency; tunable matching network;
Conference_Titel :
Microwave Conference (EuMC), 2012 42nd European
Conference_Location :
Amsterdam
Print_ISBN :
978-1-4673-2215-7
Electronic_ISBN :
978-2-87487-026-2