DocumentCode :
594516
Title :
Advanced lateral structures of BAW resonator for spurious mode suppression
Author :
Hosoo Park ; Insang Song ; Jea-Shik Shin ; Moon-Chul Lee ; Sang Uk Son ; Chul-Soo Kim ; Duck-Hwan Kim ; Jing Cui
Author_Institution :
Samsung Adv. Inst. of Technol. (SAIT), Samsung Electron., Suwon, South Korea
fYear :
2012
fDate :
Oct. 29 2012-Nov. 1 2012
Firstpage :
104
Lastpage :
107
Abstract :
To suppress spurious mode of the BAW (Bulk Acoustic Wave) resonator, advanced lateral structures are proposed. Three different techniques of apodization, air-edge reflector and border frame are integrated. Firstly, apodization is the method to design a proper shape of resonator which avoids parallel edges. By doing so, spurious mode is significantly improved at main resonances. Secondly, air-edge reflector is the method which creates lateral air interface to suppress the acoustic wave leakage. The Qa (Q-factor at anti-resonance frequency) and kt2 are improved from 420 to 640 and 6.0% to 6.7%, respectively. Thirdly, border frame is a specific thickened frame in which lateral acoustic wave cannot propagate. The Qr (Q-factor at resonance frequency) and Qa are increased from 850 to 1040 and 550 to 1670, respectively. After three techniques are integrated, the maximum value of Qr and Qa are achieved 1130 and 1920, respectively. Three practical techniques considerably improved the Q-factor and kt2 of BAW resonator which are essential parameters for low loss and wide band of RF filter configuration.
Keywords :
Q-factor; acoustic resonators; bulk acoustic wave devices; BAW resonator; Q-factor; RF filter configuration; acoustic wave leakage; advanced lateral structures; air-edge reflector; antiresonance frequency; apodization techniques; border frame; bulk acoustic wave resonator; lateral acoustic wave; resonance frequency; spurious mode suppression; Acoustic waves; Microwave filters; Q factor; Resonant frequency; Resonator filters; Simulation; air-edge reflector; apodization; border frame; bulk acoustic wave; spurious resonance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference (EuMC), 2012 42nd European
Conference_Location :
Amsterdam
Print_ISBN :
978-1-4673-2215-7
Electronic_ISBN :
978-2-87487-026-2
Type :
conf
Filename :
6459305
Link To Document :
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