Title :
A wide supply voltage and low-rx noise envelope tracking supply modulator IC for LTE handset power amplifiers
Author :
Honda, Yuma ; Yokota, Yuji ; Goto, Nasato ; Matsuno, Noriaki ; Saito, Yuya
Author_Institution :
Compound Semicond. Devices Div., Renesas Electron. Corp., Nakahara, Japan
fDate :
Oct. 29 2012-Nov. 1 2012
Abstract :
A high efficiency envelope tracking supply modulator IC for LTE handset use is presented. It is fabricated using 0.35 μm CMOS with optional 6-V-MOSFETs, and operates at a wide supply voltage range from 2.9 to 6.0 V. This enables the supply modulator to be directly connected to a lithium-ion battery. The switching noise of the supply modulator is carefully designed to meet the received band (Rx) noise requirement. An envelope tracking power amplifier (ET-PA) consisting of the modulator IC and an InGaP/GaAs-heterojunction-bipolar-transistor (HBT) PA-IC is examined with 1.95-GHz-band, 10-MHz bandwidth long-term-evolution (LTE) up-link signal. Despite a use of high-breakdown-voltage CMOS process for the modulator, the ET-PA achieves a power-added efficiency (PAE) of 33.4% at an output power of 26 dBm with an adjustment channel leakage power ratio (ACLR) of -35 dBc. In comparison with a conventional PA, the PAE has improved 3.0 and 7.3% at an output power of 26 and 20 dBm, respectively. The Rx noise is -134 dBm/Hz.
Keywords :
CMOS analogue integrated circuits; Long Term Evolution; MOSFET; UHF integrated circuits; UHF power amplifiers; mobile handsets; modulators; ET-PA; HBT PA-IC; LTE handset power amplifiers; Long-Term-Evolution up-link signal; MOSFET; PAE; adjustment channel leakage power ratio; bandwidth 10 MHz; efficiency 3.0 percent; efficiency 33.4 percent; efficiency 7.3 percent; frequency 1.95 GHz; heterojunction-bipolar-transistor; high-breakdown-voltage CMOS process; lithium-ion battery; low-Rx noise envelope tracking supply modulator IC; power-added efficiency; received band noise; size 0.35 mum; switching noise; voltage 2.9 V to 6.0 V; wide supply voltage; Capacitors; Frequency modulation; Noise; Power amplifiers; Radio frequency; Switches; Efficiency; Rx noise; envelope tracking; long term evolution (LTE); wide supply voltage range;
Conference_Titel :
Microwave Conference (EuMC), 2012 42nd European
Conference_Location :
Amsterdam
Print_ISBN :
978-1-4673-2215-7
Electronic_ISBN :
978-2-87487-026-2