FEM modeling of gigahertz TEM cells for susceptibility analysis of RFID products

This paper presents a novel simulation methodology to model the coupling between a GTEM cell and an RF-ID antenna. This model can further be used in a simulation test bench to verify the susceptibility of contactless RFID cards to RF interference from mobile phone transmissions. In this test bench the immunity test signals are injected into the contactless smart card under design within a model of a GTEM cell. A GTEM cell is used for this purpose because it is the only real-life test environment that allows exposing the DUT with a localized plane wave from 13.56 MHz up to multi-GHz frequencies. Our proposed methodology has been well verified by comparing simulations with measurements.