• DocumentCode
    594913
  • Title

    Does one rotten apple spoil the whole barrel?

  • Author

    Cheplygina, Veronika ; Tax, David M. J. ; Loog, Marco

  • Author_Institution
    Pattern Recognition Lab., Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2012
  • fDate
    11-15 Nov. 2012
  • Firstpage
    1156
  • Lastpage
    1159
  • Abstract
    Multiple Instance Learning (MIL) is concerned with learning from sets (bags) of objects (instances), where the individual instance labels are ambiguous. In MIL it is often assumed that positive bags contain at least one instance from a so-called concept in instance space. However, there are many MIL problems that do not fit this formulation well, and hence cause traditional MIL algorithms, which focus on the concept, to perform poorly. In this work we show such types of problems and the methods appropriate to deal with either situation. Furthermore, we show that an approach that learns directly from dissimilarities between bags can be adapted to deal with either problem.
  • Keywords
    learning (artificial intelligence); MIL algorithms; instance space; multiple instance learning; positive bags; supervised learning methods; Bismuth; Kernel; Pattern recognition; Shape; Standards; Training; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (ICPR), 2012 21st International Conference on
  • Conference_Location
    Tsukuba
  • ISSN
    1051-4651
  • Print_ISBN
    978-1-4673-2216-4
  • Type

    conf

  • Filename
    6460342