• DocumentCode
    594940
  • Title

    Metric learning by directly minimizing the k-NN training error

  • Author

    Chernoff, K. ; Loog, Marco ; Nielsen, Mads

  • Author_Institution
    Copenhagen Univ., Copenhagen, Denmark
  • fYear
    2012
  • fDate
    11-15 Nov. 2012
  • Firstpage
    1265
  • Lastpage
    1268
  • Abstract
    This paper presents an approach for computing global distance metrics that minimize the k-NN leave-one-out (LOO) error. The approach optimizes an energy function that corresponds to a smoothened version of the k-NN LOO error. The generalization of the proposed approach is further improved by controlling the k parameter through a heuristic. Evaluation of the proposed approach on several public datasets showed that it was able to compete with an established state-of-the art approach.
  • Keywords
    learning (artificial intelligence); LOO error minimization; energy function; global distance metrics; k-NN training error minimization; leave-one-out error minimization; metric learning; public datasets; Art; Iris; Machine learning; Measurement; Optimization; Training; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (ICPR), 2012 21st International Conference on
  • Conference_Location
    Tsukuba
  • ISSN
    1051-4651
  • Print_ISBN
    978-1-4673-2216-4
  • Type

    conf

  • Filename
    6460369