Title :
Metric learning by directly minimizing the k-NN training error
Author :
Chernoff, K. ; Loog, Marco ; Nielsen, Mads
Author_Institution :
Copenhagen Univ., Copenhagen, Denmark
Abstract :
This paper presents an approach for computing global distance metrics that minimize the k-NN leave-one-out (LOO) error. The approach optimizes an energy function that corresponds to a smoothened version of the k-NN LOO error. The generalization of the proposed approach is further improved by controlling the k parameter through a heuristic. Evaluation of the proposed approach on several public datasets showed that it was able to compete with an established state-of-the art approach.
Keywords :
learning (artificial intelligence); LOO error minimization; energy function; global distance metrics; k-NN training error minimization; leave-one-out error minimization; metric learning; public datasets; Art; Iris; Machine learning; Measurement; Optimization; Training; Vectors;
Conference_Titel :
Pattern Recognition (ICPR), 2012 21st International Conference on
Conference_Location :
Tsukuba
Print_ISBN :
978-1-4673-2216-4