• DocumentCode
    594951
  • Title

    A One-per-Class reconstruction rule for class imbalance learning

  • Author

    D´Ambrosio, Roberto ; Iannello, Giulio ; Soda, Paolo

  • Author_Institution
    Integrated Res. Centre, Univ. Campus Bio-Medico of Rome, Rome, Italy
  • fYear
    2012
  • fDate
    11-15 Nov. 2012
  • Firstpage
    1310
  • Lastpage
    1313
  • Abstract
    Class imbalance limits the performance of most learning algorithms since they cannot cope with large differences between the number of samples in each class, resulting in a low predictive accuracy over the minority ones. Several algorithms achieving more balanced performance in case of binary learning have been proposed, while few researches exists in case of multi-class learning. This paper proposes a new reconstruction rule for the One-per-Class (OpC) decomposition method that, distinguishing between safe and dangerous classifications using sample classification reliability, compensates class imbalance in multiclass recognition problems and reduces effects due to the skewness between classes. The approach has been successfully tested on five datasets using three different classification architectures, and it favourably compares with results provided both by a multiclass classifier and by a popular OpC reconstruction rule.
  • Keywords
    data mining; learning (artificial intelligence); pattern classification; OpC decomposition method; OpC reconstruction rule; binary learning; class imbalance compensation; class imbalance learning; classification architecture; learning algorithms; multiclass classifier; multiclass learning; multiclass recognition problem; one-per-class decomposition method; one-per-class reconstruction rule; predictive accuracy; sample classification reliability; Accuracy; Indexes; Machine learning; Pattern recognition; Prediction algorithms; Reliability; Support vector machines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (ICPR), 2012 21st International Conference on
  • Conference_Location
    Tsukuba
  • ISSN
    1051-4651
  • Print_ISBN
    978-1-4673-2216-4
  • Type

    conf

  • Filename
    6460380