Title :
An improved EEMD model for feature extraction and classification of gunshot in public places
Author :
Zhilong Zhang ; Weihong Li ; Weiguo Gong ; Jianhua Zhong
Author_Institution :
Key Lab. of Optoelectron. Technol. & Syst. of Educ. Minist., Chongqing Univ., Chongqing, China
Abstract :
Ensemble empirical mode decomposition (EEMD) is a noise-assisted adaptive data analysis method. The key of EEMD is to add Gauss white noise into the signal to overcome mode-mixing problem caused by original empirical mode decomposition (EMD). Because the noise in public places is natural noise with alpha stable distribution, in this paper we proposes an improved EEMD by using symmetric alpha stable (SaS) distribution instead of the Gauss distribution, and applies the improved EEMD for extracting gunshot feature. Using the improved EEMD, firstly we decompose gunshot signals into a finite number of intrinsic mode functions (IMF). Then, we use the energy ratio of each IMF components to original signal as gunshot feature for classification. The results of simulating experiment show that the improved EEMD method has good generalization abilities for the feature extraction of gunshot in public noise places.
Keywords :
Gaussian distribution; Gaussian noise; data analysis; feature extraction; image classification; EEMD model; Gauss distribution; Gauss white noise; IMF; SaS distribution; alpha stable distribution; energy ratio; ensemble empirical mode decomposition; gunshot classification; gunshot feature extraction; gunshot signal decomposition; intrinsic mode functions; mode-mixing problem; noise-assisted adaptive data analysis method; public noise places; symmetric alpha stable distribution; Empirical mode decomposition; Feature extraction; Mel frequency cepstral coefficient; Signal to noise ratio; Training; White noise; Feature extraction of gunshot; IMF components; energy ratio; ensemble empirical mode decomposition (EEMD); symmetric alpha stable distribution;
Conference_Titel :
Pattern Recognition (ICPR), 2012 21st International Conference on
Conference_Location :
Tsukuba
Print_ISBN :
978-1-4673-2216-4