DocumentCode
595443
Title
Robust regularized feature selection for iris recognition via linear programming
Author
Libin Wang ; Zhenan Sun ; Tieniu Tan
Author_Institution
Nat. Lab. of Pattern Recognition, Inst. of Autom., Beijing, China
fYear
2012
fDate
11-15 Nov. 2012
Firstpage
3358
Lastpage
3361
Abstract
Ordinal measures are robust image descriptors for encoding discriminative features of iris images. However, there are many tunable parameters in ordinal filters which can generate an over-complete feature pool. This paper proposes a novel feature selection method based on linear programming, which can learn a compact and effective ordinal feature set for iris recognition. Firstly, large margin principle is employed to obtain strong generalization capacity. Secondly, discriminative information for each feature is added to make the model more robust to noise. Finally, non-negative weight is not only interpretable but also suitable for a linear model. Additionally, the model can be efficiently solved by the Simplex algorithm. The comparative experiments are conducted on CASIA-Iris-V4 database, and the results show that our method has outperformed other state-of-the-art feature selection methods, including Adaboost and Sparsity based methods.
Keywords
feature extraction; generalisation (artificial intelligence); iris recognition; learning (artificial intelligence); linear programming; visual databases; vocabulary; Adaboost based methods; CASIA-Iris-V4 database; comparative experiments; discriminative feature encoding; discriminative information; generalization capacity; iris images; iris recognition; linear programming; margin principle; nonnegative weight; ordinal feature set; ordinal filters; over-complete feature pool; robust image descriptors; robust regularized feature selection methods; simplex algorithm; sparsity based methods; state-of-the-art feature selection methods; tunable parameters; Adaptation models; Databases; Feature extraction; Iris recognition; Linear programming; Robustness; Training;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition (ICPR), 2012 21st International Conference on
Conference_Location
Tsukuba
ISSN
1051-4651
Print_ISBN
978-1-4673-2216-4
Type
conf
Filename
6460884
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