Title :
Differentiated Doping Profile for Vertical Terahertz GaN Transferred-Electron Devices
Author :
Dalle, Christophe Francois
Author_Institution :
Dept. Hyperfreq. et Semicond., Inst. d´Electron. de Microelectron. et de Nanotechnol., Villeneuve d´Ascq, France
Abstract :
The potential of vertical differentiated gallium nitride (GaN) transferred electron devices (TEDs) is compared with that of the base flat doping profile TED for the realization of RF power sources at 1 THz. The TED oscillator modeling is a time-domain continuous wave pure sine model. The semiconductor device model is a 1-D numerical physical macroscopic model based on the energy-momentum approach. Differentiated structures of notch, detached notch, and P+ spike (PS) types have been optimized. By contrast with millimeter-wave differentiated TEDs operating in the dipole domain mode, the terahertz TED RF operating mode remains the accumulation layer/transit time mode. Comparison point out that the differentiated doping profile TEDs slightly improve both the TED RF performance and electronic limitation but above all improve the thermal limitation resulting from the high dc bias conditions due to high threshold electric field in GaN. Thus, the PS TED distinguishes itself as the most promising structure.
Keywords :
Gunn devices; III-V semiconductors; doping profiles; gallium compounds; semiconductor device models; semiconductor doping; terahertz wave devices; wide band gap semiconductors; 1D numerical physical macroscopic model; GaN; P+ spike type notch; TED oscillator modeling; detached notch; differentiated doping profile; dipole domain mode; energy-momentum approach; frequency 1 THz; millimeter-wave differentiated TEDs; semiconductor device model; terahertz TED; time-domain continuous wave pure sine model; vertical terahertz transferred-electron devices; Doping; Gallium nitride; Oscillators; Performance evaluation; Radio frequency; Resistance; Semiconductor process modeling; Differentiated doping profile; fundamental accumulation layer and transit time operating mode; time-domain energy-momentum modeling; vertical terahertz gallium nitride (GaN) transferred electron device (TED); vertical terahertz gallium nitride (GaN) transferred electron device (TED).;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2015.2392158