Testing wireless transceivers´ RF front-ends utilizing defect-oriented BIST techniques

Author

Dermetzoglou, L. ; Liaperdos, John ; Arapoyanni, Angela ; Tsiatouhas, Y.

Author_Institution

Dept. of Inf. & Telecommun., Univ. of Athens, Athens, Greece

fYear

2012

fDate

9-12 Dec. 2012

Firstpage

961

Lastpage

964

Abstract

In modern nanotechnologies, the testing of embedded wireless transceivers´ RF front-ends is a great concern. The test technique presented in this work is based on dedicated built-in self test (BIST) structures for each building block of the transceiver. These BIST circuits utilize defect-oriented test techniques. Experimental results on a CMOS transceiver design are discussed to accentuate the efficiency of the proposed scheme.

Keywords

CMOS integrated circuits; built-in self test; embedded systems; integrated circuit testing; nanotechnology; transceivers; BIST circuits; BIST structures; CMOS transceiver design; building block; dedicated built-in self test structures; defect-oriented BIST techniques; defect-oriented test techniques; embedded wireless transceivers RF front-ends; nanotechnology; testing wireless transceivers; Built-in self-test; Circuit faults; Mixers; Radio frequency; Receivers; Transceivers;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics, Circuits and Systems (ICECS), 2012 19th IEEE International Conference on

Conference_Location

Seville

Print_ISBN

978-1-4673-1261-5

Electronic_ISBN

978-1-4673-1259-2

Type

conf

DOI

10.1109/ICECS.2012.6463501

Filename

6463501