Fullwave-mode analysis of shielded microstrip discontinuities on anisotropic substrates

Author

Madani, Omid ; Tounsi, M.L. ; Yagoub, M.C.E.

Author_Institution

Lab. des Radiocommun. Mobiles, Univ. Saad-Dahlab., Blida, Algeria

fYear

2012

fDate

9-12 Dec. 2012

Firstpage

709

Lastpage

712

Abstract

This paper presents a full-wave FDTD analysis of open/shielded microstrip discontinuities on anisotropic substrates through the evaluation of their S parameters. A wideband Gaussian pulse excitation was used to obtain frequency-domain information from dc up to the desired cutoff frequency. Numerical results demonstrate the necessity to include the effect of dielectric anisotropy in the modeling of microstrip discontinuities.

Keywords

Gaussian processes; S-parameters; dielectric materials; finite difference time-domain analysis; frequency-domain analysis; microstrip circuits; S parameter; anisotropic substrate; dielectric anisotropy; frequency-domain information; full-wave FDTD analysis; full-wave-mode analysis; open/shielded microstrip discontinuities; wideband Gaussian pulse excitation; Finite difference methods; Microstrip; Microstrip filters; Microwave circuits; Scattering parameters; Substrates; Time domain analysis; Anisotropy; FDTD method; discontinuities; filters;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics, Circuits and Systems (ICECS), 2012 19th IEEE International Conference on

Conference_Location

Seville

Print_ISBN

978-1-4673-1261-5

Electronic_ISBN

978-1-4673-1259-2

Type

conf

DOI

10.1109/ICECS.2012.6463627

Filename

6463627