• DocumentCode
    596996
  • Title

    Reducing bit flipping problems in SRAM physical unclonable functions for chip identification

  • Author

    Eiroa, Susana ; Castro, Jose ; Martinez-Rodriguez, Macarena Cristina ; Tena, Erica ; Brox, Piedad ; Baturone, Iluminada

  • Author_Institution
    Dept. Electron. & Electromagn., Univ. of Seville, Seville, Spain
  • fYear
    2012
  • fDate
    9-12 Dec. 2012
  • Firstpage
    392
  • Lastpage
    395
  • Abstract
    Physical Unclonable functions (PUFs) have appeared as a promising solution to provide security in hardware. SRAM PUFs offer the advantage, over other PUF constructions, of reusing resources (memories) that already exist in many designs. However, their intrinsic noisy nature produces the so called bit flipping effect, which is a problem in circuit identification and secret key generation. The approaches reported to reduce this effect usually resort to the use of pre- and post-processing steps (such as Fuzzy Extractor structures combined with Error Correcting Codes), which increase the complexity of the system. This paper proposes a pre-processing step that reduces bit flipping problems without increasing the hardware complexity. The proposal has been verified experimentally with 90-nm SRAMs included in digital application specific integrated circuits (ASICs).
  • Keywords
    SRAM chips; application specific integrated circuits; ASIC; PUF constructions; SRAM physical unclonable functions; bit flipping problem reduction; chip identification; digital application specific integrated circuits; error correcting codes; fuzzy extractor structures; hardware complexity; hardware security; intrinsic noisy nature; postprocessing steps; preprocessing steps; secret key generation; size 90 nm; Application specific integrated circuits; Hardware; Power supplies; Random access memory; Reliability; Temperature measurement; IC identification; SRAM PUFs; hardware security;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits and Systems (ICECS), 2012 19th IEEE International Conference on
  • Conference_Location
    Seville
  • Print_ISBN
    978-1-4673-1261-5
  • Electronic_ISBN
    978-1-4673-1259-2
  • Type

    conf

  • DOI
    10.1109/ICECS.2012.6463720
  • Filename
    6463720