Title :
Metrological characterization of reference standard resistors group of 100 Ω by means of Hamon resistor
Author :
Cimeanu, L. ; Simionescu, M.
Author_Institution :
Electromagn. Quantities Lab., Nat. Inst. of Metrol., Bucharest, Romania
Abstract :
This paper presents a method for assigning the conventional value of a 100 Ω resistors group against a reference standard resistor of 1 Ω, traceable to SI, using a Hamon resistor. It is also presented the estimation of the uncertainty assigned to resistors conventional values, according to EA-4/02.
Keywords :
calibration; electric resistance measurement; resistors; Hamon resistor; calibration; reference standard resistor group metrological characterization; resistance 1 ohm; resistance 100 ohm; Calibration; Electrical resistance measurement; Resistance; Resistors; Standards; Temperature measurement; Uncertainty; Hamon resistor; electrical resistance; measurement uncertainty; resistor; standard;
Conference_Titel :
Electrical and Power Engineering (EPE), 2012 International Conference and Exposition on
Conference_Location :
Iasi
Print_ISBN :
978-1-4673-1173-1
DOI :
10.1109/ICEPE.2012.6463835
