DocumentCode :
597492
Title :
A multi-stage discrete event simulation approach for scheduling of maintenance activities in a semiconductor manufacturing line
Author :
Scholl, Wolfgang ; Mosinski, Marcin ; Gan, B.P. ; Lendermann, Peter ; Preuss, Patrick ; Noack, D.
Author_Institution :
Infineon Technol. Dresden, Dresden, Germany
fYear :
2012
fDate :
9-12 Dec. 2012
Firstpage :
1
Lastpage :
10
Abstract :
Discrete event simulation (DES) has been established as a frequently used decision-support method in semiconductor manufacturing. One of the key application areas is the planning and scheduling of extended (several days) maintenance activities. The first stage of maintenance activity planning is conducted with a transient long-term simulation model with the focus on evaluating the effect of maintenance activity on the expected fab performance. Decisions such as wafer start reduction or adjustment of delivery commitments among affected work centers are made. The second stage of the planning is initiated several days before the start of the maintenance activities, where resource planning and scheduling of the activity is done through assessment of the expected WIP situation forecasted by a high fidelity online simulation model. In this paper, we will explain this simulation-based multi-stage approach for maintenance activity scheduling. The associated benefits and challenges will be presented with an example use case.
Keywords :
decision support systems; discrete event simulation; electronic engineering computing; maintenance engineering; planning; scheduling; semiconductor device manufacture; work in progress; DES; WIP situation; affected work centers; associated benefits; decision-support method; delivery commitments; expected fab performance; extended maintenance activity; maintenance activity planning; maintenance activity scheduling; multistage discrete event simulation approach; online simulation model; resource planning; resource scheduling; semiconductor manufacturing line; simulation-based multistage approach; transient long-term simulation model; wafer start adjustment; wafer start reduction; Availability; Computational modeling; Data models; Maintenance engineering; Planning; Predictive models; Semiconductor device modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation Conference (WSC), Proceedings of the 2012 Winter
Conference_Location :
Berlin
ISSN :
0891-7736
Print_ISBN :
978-1-4673-4779-2
Electronic_ISBN :
0891-7736
Type :
conf
DOI :
10.1109/WSC.2012.6465320
Filename :
6465320
Link To Document :
بازگشت