DocumentCode
597641
Title
Electronic structure of Ge/Six Sny Ge1−x−y quantum dots
Author
Chen, Jiann-Jong ; Fan, W.J. ; Zhang, D.H. ; Xu, Qi ; Zhang, X.W.
Author_Institution
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear
2013
fDate
2-4 Jan. 2013
Firstpage
437
Lastpage
442
Abstract
The electronic band structures and optical gains of Ge/SixSnyGe1-x-y truncated pyramid-shaped quantum dots (QDs) are calculated using the 8-band k.p model. The large bowing factors in the calculation of band gaps of both Ã-conduction and L-conduction valley in the barrier are considered so that the band gaps of the barrier are small. The strains are calculated by constant strain method and valence force field (VFF) method. By constant strain method, strains are uniformly distributed in the QD, and there is no strain in the barrier. Due to the small conduction band offset and strong quantum confinement effect, it requires greater tensile strain to make Ge QD a direct-band material by setting Si and Sn compositions at 11% and 26% respectively. By VFF method which considers the four nearest-neighbour interactions for each atom, the calculated strains are not uniform and the strains exist in the barrier. These barrier strains have raised the valence band edge of the barrier and changed the potential profile of the structure, so that the holes may not be confined in the QD. The VFF method should be more accurate to reflect the real situation.
Keywords
Ge-Si alloys; bending; conduction bands; elemental semiconductors; energy gap; germanium; k.p calculations; semiconductor quantum dots; tensile strength; tin compounds; valence bands; Γ-conduction valley; 8-band k.p model; Ge-SixSnyGe1-x-y; L-conduction valley; band gap; barrier strains; bowing factors; conduction band offset; constant strain method; electronic band structure; nearest-neighbour interactions; optical gain; potential profile; quantum confinement effect; tensile strain; truncated pyramid-shaped quantum dots; valence band edge; valence force field method; Conferences; Decision support systems; Nanoelectronics; 73.21.La; 73.22.-f; 78.67.Hc; Band structure; Germanium; k.p method; optical gain PACS; quantum dots;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanoelectronics Conference (INEC), 2013 IEEE 5th International
Conference_Location
Singapore
ISSN
2159-3523
Print_ISBN
978-1-4673-4840-9
Electronic_ISBN
2159-3523
Type
conf
DOI
10.1109/INEC.2013.6466071
Filename
6466071
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