Inspecting the effects of post-annealing on ZnO nanorods by optical second harmonic generation

Author

Chung-Wei Liu ; Shoou-Jinn Chang ; Chun-Chu Liu ; Ruei-Jie Huang ; Yan-Shen Lin ; Min-Chia Su ; Peng-Han Wang ; Kuang-Yao Lo

Author_Institution

Dept. of Electr. Eng. & Center for Micro/Nano Sci. & Technol., Nat. Cheng Kung Univ., Tainan, Taiwan

fYear

2013

fDate

2-4 Jan. 2013

Firstpage

505

Lastpage

507

Abstract

We report on the effects of post-annealing on ZnO nanorods array using optical second harmonic generation (SHG). The high-quality and nearly vertically aligned ZnO nanorod arrays were deposited on ZnO-seeded glass substrates by aqueous solution method. The SHG result indicated the transformation of oxygen deficiency on ZnO nanorods surface after post-annealing treatment process. The chemical composition of the nanorods was investigated by X-ray photoelectron spectroscopy. The corresponding structural properties of the nanorod arrays were investigated by scanning electron microscopy and X-ray diffraction.

Keywords

II-VI semiconductors; X-ray diffraction; X-ray photoelectron spectra; annealing; nanofabrication; nanorods; optical harmonic generation; scanning electron microscopy; semiconductor growth; surface structure; surface treatment; vacancies (crystal); wide band gap semiconductors; zinc compounds; SHG; X-ray diffraction; X-ray photoelectron spectroscopy; ZnO; ZnO-SiO₂; aqueous solution method; chemical composition; optical second harmonic generation; oxygen deficiency; oxygen vacancy defects; post-annealing; scanning electron microscopy; structural properties; surface structure; surface treatment; zinc oxide nanorod array; zinc oxide-seeded glass substrates; Annealing; Glass; Substrates; Surface morphology; Surface treatment; X-ray scattering; Zinc oxide; ZnO; annealing and SHG; nanorod;

fLanguage

English

Publisher

ieee

Conference_Titel

Nanoelectronics Conference (INEC), 2013 IEEE 5th International

Conference_Location

Singapore

ISSN

2159-3523

Print_ISBN

978-1-4673-4840-9

Electronic_ISBN

2159-3523

Type

conf

DOI

10.1109/INEC.2013.6466091

Filename

6466091