DocumentCode :
597838
Title :
The SuperJunction MOS-controlled thyristor (SJ-MCT) with low power loss for high-power switching applications
Author :
Wanjun Chen ; Jinhan Zhang ; Bo Zhang ; Huaping Jiang ; Zhaoji Li
Author_Institution :
State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China (UESTC), Chengdu, China
fYear :
2012
fDate :
Oct. 29 2012-Nov. 1 2012
Firstpage :
1
Lastpage :
3
Abstract :
In this paper, a novel MOS controlled-thyristor (MCT) that employs the SuperJunction concept (SJ-MCT) has been investigated, for the first time. The SJ-MCT offers significant improvement in the on-state voltage drop (Von) and turn-off switching loss (Eoff) compared with the state-of-the-art conventional MCT. In the on-state, due to the p-type pillar of the SJ structure in the SJ-MCT drift region, an effective collector area of the lower PNP transistor in MCT is enlarged, which results in higher conductivity modulation and then lower Von. For the turn-off of SJ-MCT, the introduction of SJ structure in the drift region is helpful to extract the minority carriers stored in the drift region during the forward conduction, which leads to lower turn-off time and then lower Eoff. In addition, the SuperJunction structure can deliver charge balance in the drift region results in smaller drift lengths and higher doping levels, which also contributes to better on-state/switching trade-off. At the condition of anode current density of 400 A/cm2, the Von and Eoff of SJ-MCT is 1.12 V and 6.7mJ, compared with 1.34V and 11 mJ for MCT, respectively.
Keywords :
MOS-controlled thyristors; anodes; current density; doping profiles; electrical conductivity; minority carriers; p-n junctions; power MOSFET; thyristor applications; PNP transistor; SJ structure; SJ-MCT drift region; anode current density; charge balancing; collector area; conductivity modulation; doping levels; drift lengths; forward conduction; high-power switching applications; low power loss; minority carrier extraction; on-state voltage drop improvement; p-type pillar; superjunction MOS-controlled thyristor; turn-off switching loss; turn-off time; Anodes; Current density; Doping; Insulated gate bipolar transistors; Logic gates; Switches; Thyristors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2012 IEEE 11th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4673-2474-8
Type :
conf
DOI :
10.1109/ICSICT.2012.6466725
Filename :
6466725
Link To Document :
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