• DocumentCode
    597867
  • Title

    Piecewise single view Photometric Stereo with multi-view constraints

  • Author

    Sabzevari, Reza ; Del Bue, Alessio ; Murino, Vittorio

  • Author_Institution
    PAVIS - Pattern Anal. & Comput. Vision, Ist. Italiano di Tecnol. (IIT), Genoa, Italy
  • fYear
    2012
  • fDate
    Sept. 30 2012-Oct. 3 2012
  • Firstpage
    21
  • Lastpage
    24
  • Abstract
    This paper presents a novel Photometric Stereo approach for static views that recasts the problem into a piecewise formulation. The proposed algorithm, called Piecewise Photometric Stereo (PPS), entails several advantages in respect to previous global approaches. It is intrinsically more efficient, since reconstructing the surface in patches is computationally faster than reconstructing the global surface. Each patch has been associated an individual photometric model rather than a single global model as used in classical approaches. In this way, the piecewise formulation may grasp more complex lighting effects. Finally, the global metric properties of the shape is preserved using the multi-view constraints. In this pipeline, structure from motion is exploited to define such set of constraints and to compose a 3D mesh representing the metric structure of the object. Real results with ground truth show the positive performance of our algorithm compared with a classical global approach for Photometric Stereo.
  • Keywords
    image motion analysis; image reconstruction; image representation; stereo image processing; 3D mesh representation; PPS algorithm; lighting effect; multiview constraint; photometric model; piecewise single view photometric stereo; shape metric property; static view; structure-from-motion; surface reconstruction; Image reconstruction; Lighting; Measurement; Pipelines; Shape; Stereo vision; Surface reconstruction; 3D reconstruction; Computational Geometry; Photometric Stereo; Structure from Motion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2012 19th IEEE International Conference on
  • Conference_Location
    Orlando, FL
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4673-2534-9
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2012.6466785
  • Filename
    6466785