Title :
Countering anti-JPEG compression forensics
Author :
Haodong Li ; Weiqi Luo ; Jiwu Huang
Author_Institution :
Sch. of Software, Sun Yat-sen Univ., Guangzhou, China
fDate :
Sept. 30 2012-Oct. 3 2012
Abstract :
The quantization artifacts and blocking artifacts are the two significant properties in the JPEG compressed images. Most relative forensic techniques usually use such inherent properties to provide some evidences on how image data is acquired and/or processed. A wise attacker, however, may perform some post-operations to confuse the two artifacts to fool current forensic techniques. Recently, Stamm et al. in [1] propose a novel anti-JPEG compression method via adding anti-forensic dither to the DCT coefficients and further reducing the blocking artifacts. In this paper, we found that the dithering operation will inevitably destroy the statistical correlations among the 8 × 8 intrablock and interblock within an image. In the view of JPEG steganalysis, we employ the transition probability matrix of the DCT coefficients to measure such modifications for identifying the forged images from those original JPEG decompressed images and uncompressed ones. On average, we can obtain a detection accuracy as high as 99% on the image database of UCID [2].
Keywords :
correlation methods; data compression; discrete cosine transforms; image coding; image forensics; probability; quantisation (signal); steganography; DCT coefficient; JPEG compressed image; JPEG decompressed image; JPEG steganalysis; antiJPEG compression forensics; antiforensic dithering; attacker; blocking artifact; detection accuracy; forged image; image database; image interblock; image intrablock; quantization artifact; statistical correlation; transition probability matrix; Accuracy; Correlation; Discrete cosine transforms; Forensics; Image coding; Quantization; Transform coding; Anti-Forensics; JPEG Compression; JPEG Steganalysis;
Conference_Titel :
Image Processing (ICIP), 2012 19th IEEE International Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4673-2534-9
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2012.6466840