Title :
L2-Norm metric learning applied to unconstrained face pair-matching
Author :
Barreto, R.M. ; Ren, T.I. ; Cavalcanti, G.D.C.
Author_Institution :
Center for Inf., Fed. Univ. of Pernambuco, Recife, Brazil
fDate :
Sept. 30 2012-Oct. 3 2012
Abstract :
This paper proposes a metric learning algorithm based on the L2-Norm (L2ML) in the context of the face pair-matching problem as an attempt to overcome the low discriminatory power of most current descriptors when the operating conditions are unconstrained. The L2ML differs from other similar techniques by giving an efficient closed-form solution to a relatively simple optimization objective. As the experiments show, despite the simplicity, the performance of the proposed method is comparable to that of more complex state of the art techniques. In fact, the combination of only two descriptors in the L2ML space reaches an average accuracy of 84.97% in the challenging Image Restricted benchmark of the aligned Labeled Faces in the Wild (LFW) dataset.
Keywords :
face recognition; image matching; learning (artificial intelligence); L2-norm metric learning; L2ML; closed-form solution; face pair-matching problem; image restricted benchmark; labeled faces in the wild dataset; low discriminatory power; metric learning algorithm; optimization; unconstrained face pair-matching; Accuracy; Benchmark testing; Face; Face recognition; Feature extraction; Measurement; Vectors; L2-Norm; L2ML; metric learning; unconstrained face pair-matching;
Conference_Titel :
Image Processing (ICIP), 2012 19th IEEE International Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4673-2534-9
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2012.6466926