DocumentCode
597999
Title
Restricted guided filter with SURE-LET-based parameter optimization
Author
Cuong Cao Pham ; Jae Wook Jeon
Author_Institution
Sch. of Inf. & Commun. Eng., Sungkyunkwan Univ., Suwon, South Korea
fYear
2012
fDate
Sept. 30 2012-Oct. 3 2012
Firstpage
993
Lastpage
996
Abstract
Guided image filtering has recently emerged as an effective technique for noise reduction and edge-preserving smoothing operation due to its appealing properties. It outperforms conventional bilateral filtering in a variety of applications in terms of both quality and computational cost. However, the combination of smoothing parameters (ε and Ωs) that delivers optimal results has not yet been reported, and the contrast of the filtered output is considerably reduced. In this paper, we present a restricted version of guided filtering that has better contrast-preserving characteristics, and use Stein´s unbiased risk estimate (SURE) with an exhaustive search or a linear expansion of threshold (LET) to optimally tune the two above parameters. With SURE, the mean squared error (MSE) can be unbiasedly estimated without the requirement of the noise-free image. Experiments verified the accuracy of the SURE derivation and its effectiveness with respect to providing a better trade off between two interrelated objectives - noise reduction and edge-preservation.
Keywords
image denoising; search problems; smoothing methods; MSE; SURE-LET-based parameter optimization; Stein unbiased risk estimate; bilateral filtering; contrast-preserving characteristics; edge-preserving smoothing operation; exhaustive search; guided image filtering; linear expansion of threshold; mean squared error; noise reduction; noise-free image; restricted guided filter; smoothing parameter; Image processing; Kernel; Noise reduction; Optimization; PSNR; Smoothing methods; Guided image filtering; Stein´s unbiased risk estimator; noise reduction; parameter optimization;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing (ICIP), 2012 19th IEEE International Conference on
Conference_Location
Orlando, FL
ISSN
1522-4880
Print_ISBN
978-1-4673-2534-9
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2012.6467029
Filename
6467029
Link To Document