Title :
An improved X-filling strategy based on the Multilayer Data Copy scheme for test data and power reduction for SoC
Author :
Qing Zhao ; Xiao Le Cui ; Chung Len Lee
Author_Institution :
Shenzhen Grad. Sch., Key Lab. of Integrated Microsyst., Peking Univ., Shenzhen, China
fDate :
Oct. 29 2012-Nov. 1 2012
Abstract :
Multilayer Data Copy (MDC) [1] is an effective test data compression scheme for achieving low shift-in power for the multiple scan chain of SoC. This work improves the scheme by employing a B-filling strategy to fill X (don´t care) bits to further reduce the test data volume and the test power. Experimental results show that it can achieve more 3% of the test data volume reduction and more than two times of power savings on benchmark circuits.
Keywords :
automatic test pattern generation; integrated circuit testing; system-on-chip; B-filling strategy; SoC testing; X-filling strategy; benchmark circuits; multilayer data copy scheme; multiple scan chain; power reduction; power savings; system-on-chip; test data compression; test data volume reduction; Decoding; Filling; Nonhomogeneous media; System-on-a-chip; Test data compression; Testing; Very large scale integration; SoC testing; low power; test data compression; test pattern generation;
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2012 IEEE 11th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4673-2474-8
DOI :
10.1109/ICSICT.2012.6467880
