An improved X-filling strategy based on the Multilayer Data Copy scheme for test data and power reduction for SoC

Author

Qing Zhao ; Xiao Le Cui ; Chung Len Lee

Author_Institution

Shenzhen Grad. Sch., Key Lab. of Integrated Microsyst., Peking Univ., Shenzhen, China

fYear

2012

fDate

Oct. 29 2012-Nov. 1 2012

Firstpage

1

Lastpage

3

Abstract

Multilayer Data Copy (MDC) [1] is an effective test data compression scheme for achieving low shift-in power for the multiple scan chain of SoC. This work improves the scheme by employing a B-filling strategy to fill X (don´t care) bits to further reduce the test data volume and the test power. Experimental results show that it can achieve more 3% of the test data volume reduction and more than two times of power savings on benchmark circuits.

Keywords

automatic test pattern generation; integrated circuit testing; system-on-chip; B-filling strategy; SoC testing; X-filling strategy; benchmark circuits; multilayer data copy scheme; multiple scan chain; power reduction; power savings; system-on-chip; test data compression; test data volume reduction; Decoding; Filling; Nonhomogeneous media; System-on-a-chip; Test data compression; Testing; Very large scale integration; SoC testing; low power; test data compression; test pattern generation;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State and Integrated Circuit Technology (ICSICT), 2012 IEEE 11th International Conference on

Conference_Location

Xi´an

Print_ISBN

978-1-4673-2474-8

Type

conf

DOI

10.1109/ICSICT.2012.6467880

Filename

6467880