Title :
A random walk model based approach for quantifying technology emergence and impact for research articles
Author :
Xie, Ying ; Raghavan, Vijay V.
Author_Institution :
Department of Computer Science, Kennesaw State University, Georgia, USA
Abstract :
This article presents our proposal of using a random walk model based approach for quantifying technology emergence and impact for research articles based on a concept map extracted from related literature databases. The same approach should be easily adapted to citation networks and author networks.
Keywords :
emergence detection; quantifying technology emergence and impact; random walk model; text mining;
Conference_Titel :
Granular Computing (GrC), 2012 IEEE International Conference on
Conference_Location :
Hangzhou, China
Print_ISBN :
978-1-4673-2310-9
DOI :
10.1109/GrC.2012.6468571
