Title :
Straintronics-Based Random Access Memory as Universal Data Storage Devices
Author :
Barangi, Mahmood ; Mazumder, Pinaki
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
Abstract :
Nanomagnetic and spin-based memories are distinguished for their high data endurance in comparison with their charge-based peers. However, they have drawbacks, such as high write energy and poor scalability due to high write current. In this paper, we apply the straintronics principle that seeks the combination of piezoelectricity and inverse magnetostriction (Villari effect), to design a proof-of-principle 2 Kb nonvolatile magnetic memory in 65 nm CMOS technology. Our simulation results show read-access and write-cycle energies as low as 49 and 143 fJ/b, respectively. At a nominal supply level of 1 V, reading can be performed as fast as 562 MHz. Write error rates <;10-7 and 10-15 can be obtained at 10 and 5 MHz, respectively. In addition to nonvolatility, ultralow energy per operation, and high performance, our STRs memory has a high storage density with a cell size as small as 0.2 μm2.
Keywords :
CMOS memory circuits; MRAM devices; magnetostriction; piezoelectricity; CMOS technology; STRs memory; Villari effect; frequency 10 MHz; frequency 5 MHz; high data endurance; inverse magnetostriction; nanomagnetic memories; nonvolatile magnetic memory; piezoelectricity; read-access energy; size 65 nm; spin-based memories; storage capacity 2 Kbit; straintronics-based random access memory; universal data storage devices; voltage 1 V; write-cycle energy; Anisotropic magnetoresistance; Cobalt; Magnetization; Magnetostriction; Random access memory; Stress; Vectors; Active power; CMOS; Energy barrier; Leakage power; MTJ; Magnetization; Magnetostriction; Non-volatility; Piezoelectricity; Strain; Straintronics; Stress; Universal memory; Villari effect; energy barrier; leakage power; magnetic tunneling junction (MTJ); magnetization; magnetostriction; nonvolatility; piezoelectricity; strain; straintronics (STRs); stress; universal memory;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2014.2374556