Faster scanning performance of OMPC controlled AFM

Author

Rana, M.S. ; Pota, Hemanshu R.

Author_Institution

Sch. of Eng. & Inf. Technol., Univ. of New South Wales, Canberra, ACT, Australia

fYear

2012

fDate

20-22 Dec. 2012

Firstpage

779

Lastpage

782

Abstract

This paper addresses the design and experimental implementation of an observer based model predictive control (OMPC) scheme for improved imaging of an atomic force microscope (AFM). An identified model of the AFM piezoelectric tube (PZT) scanner is used to design the proposed controller. A Kalman filter is used to obtain full state information and also to filter the output sensor noise. To evaluate the performance improvement using the proposed control scheme an experimental comparison has been made with scanned images between the proposed controller and the open-loop AFM images. This comparison shows the expediency of the proposed controller.

Keywords

Kalman filters; atomic force microscopy; observers; piezoelectric actuators; predictive control; sensors; AFM piezoelectric tube scanner; Kalman filter; OMPC controlled AFM; PZT scanner; atomic force microscope; faster scanning performance; observer based model predictive control scheme; open-loop AFM images; output sensor noise; Frequency measurement; Hysteresis; Kalman filters; Microscopy; Noise; Observers; Vibrations; Atomic force microscope (AFM); Kalman filter; model predictive control (MPC); resonant mode; system identification;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical & Computer Engineering (ICECE), 2012 7th International Conference on

Conference_Location

Dhaka

Print_ISBN

978-1-4673-1434-3

Type

conf

DOI

10.1109/ICECE.2012.6471666

Filename

6471666