DocumentCode :
599775
Title :
Faster scanning performance of OMPC controlled AFM
Author :
Rana, M.S. ; Pota, Hemanshu R.
Author_Institution :
Sch. of Eng. & Inf. Technol., Univ. of New South Wales, Canberra, ACT, Australia
fYear :
2012
fDate :
20-22 Dec. 2012
Firstpage :
779
Lastpage :
782
Abstract :
This paper addresses the design and experimental implementation of an observer based model predictive control (OMPC) scheme for improved imaging of an atomic force microscope (AFM). An identified model of the AFM piezoelectric tube (PZT) scanner is used to design the proposed controller. A Kalman filter is used to obtain full state information and also to filter the output sensor noise. To evaluate the performance improvement using the proposed control scheme an experimental comparison has been made with scanned images between the proposed controller and the open-loop AFM images. This comparison shows the expediency of the proposed controller.
Keywords :
Kalman filters; atomic force microscopy; observers; piezoelectric actuators; predictive control; sensors; AFM piezoelectric tube scanner; Kalman filter; OMPC controlled AFM; PZT scanner; atomic force microscope; faster scanning performance; observer based model predictive control scheme; open-loop AFM images; output sensor noise; Frequency measurement; Hysteresis; Kalman filters; Microscopy; Noise; Observers; Vibrations; Atomic force microscope (AFM); Kalman filter; model predictive control (MPC); resonant mode; system identification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical & Computer Engineering (ICECE), 2012 7th International Conference on
Conference_Location :
Dhaka
Print_ISBN :
978-1-4673-1434-3
Type :
conf
DOI :
10.1109/ICECE.2012.6471666
Filename :
6471666
Link To Document :
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