DocumentCode :
599785
Title :
A comparative study of potential distribution of a thin film SOI p-channel four gate transistor
Author :
Haq, A. F. M. Saniul ; Noor, Samantha Lubaba ; Hassan, Mehdi ; Islam, Md Shariful ; Debnath, Bishwajit ; Khan, M. Ziaur Rahman
Author_Institution :
Dept. of Electr. & Electron. Eng., Bangladesh Univ. of Eng. & Technol., Dhaka, Bangladesh
fYear :
2012
fDate :
20-22 Dec. 2012
Firstpage :
818
Lastpage :
821
Abstract :
A comparative study of two different analytical models of accumulation-mode SOI p-channel G4-FET has been reported and accuracy of the models has been observed under different parametric variation and biasing conditions. A numerical model is developed by Silvaco/ATLAS 3-D simulator which incorporates various non ideal effects like concentration dependant mobility, Shockley-Read-Hall recombination, Auger recombination and bandgap narrowing effect. The accuracy of the analytical models are tested by the numerical model. The performance of varying different parameters like length, width, silicon thickness and gate biasing is also observed between lateral junction gates and between top and bottom gates.
Keywords :
field effect transistors; numerical analysis; semiconductor thin films; Auger recombination; SOI p channel G4 FET; Shockley Read Hall recombination; Silvaco/ATLAS 3D simulator; analytical models; bandgap narrowing effect; biasing conditions; concentration dependant mobility; gate biasing; lateral junction gates; numerical model; parametric variation; silicon thickness; thin film SOI p channel four gate transistor; Logic gates; Numerical models; Four Gate Transistor; Potential distribution; SOI technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical & Computer Engineering (ICECE), 2012 7th International Conference on
Conference_Location :
Dhaka
Print_ISBN :
978-1-4673-1434-3
Type :
conf
DOI :
10.1109/ICECE.2012.6471676
Filename :
6471676
Link To Document :
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