DocumentCode :
599829
Title :
Optical switching and photoluminescence in erbium implanted vanadium dioxide thin films
Author :
Lim, H. ; McCallum, J.C. ; Stavrias, N. ; Marvel, R.E. ; Haglund, R.F.
Author_Institution :
Sch. of Phys., Univ. of Melbourne, Melbourne, VIC, Australia
fYear :
2012
fDate :
12-14 Dec. 2012
Firstpage :
25
Lastpage :
26
Abstract :
Vanadium dioxide (VO2) undergoes an insulator-metal transition (IMT) that involves drastic changes in its electrical and optical properties at relatively low critical temperature Tc ≈ 67°C [1]. The switching speed when triggered by an optical impulse is incredibly fast, within a femtosecond timescale [2]. Erbium (Er3+) with a stimulated emission at the standard telecommunication wave-length of 1535nm has been used extensively in fiber-optic communication systems [3]. The combination of VO2 and Er3+ could make an ultrafast optical switch that is capable of simultaneous signal amplification. In this work, we investigated the possibilities of making such a device, both theoretically and experimentally. Our experimental methods involve temperature-driven optical switching tests and photoluminescence (PL) spectroscopy on Er3+ implanted VO2 thin films. The observations of the IMT of VO2 and the PL of Er3+ in the thin films would be vital in determining whether the VO2:Er system would work as an optical switch and amplifier. A range of implantation and post-annealing schemes were explored in an attempt to find the optimal processing conditions that would maximize the qualities of the optical switching and PL.
Keywords :
ion implantation; optical fibre communication; optical switches; photoluminescence; thin films; amplifier; erbium implanted vanadium dioxide thin films; femtosecond timescale; fiber optic communication system; insulator metal transition; optical impulse; optical switching speed; optimal processing condition; photoluminescence spectroscopy; post annealing scheme; simultaneous signal amplification; standard telecommunication wavelength; stimulated emission; temperature driven optical switching test; ultrafast optical switch; Erbium; Optical amplifiers; Optical fibers; Optical films; Optical switches; Ultrafast optics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optoelectronic and Microelectronic Materials & Devices (COMMAD), 2012 Conference on
Conference_Location :
Melbourne, VIC
ISSN :
1097-2137
Print_ISBN :
978-1-4673-3047-3
Type :
conf
DOI :
10.1109/COMMAD.2012.6472342
Filename :
6472342
Link To Document :
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