DocumentCode
599918
Title
Enhanced UV-blue response of back illuminated deep double junction CMOS compatible photodiode pixels; a simulation study of high resolution pixel arrays
Author
Jansz, P.V. ; Hinckley, S.
Author_Institution
Centre for Commun. Eng. Res., Edith Cowan Univ., Joondalup, WA, Australia
fYear
2012
fDate
12-14 Dec. 2012
Firstpage
211
Lastpage
212
Abstract
Simulated backwall U/V blue illuminated double junction photodiode (DJPD) pixels demonstrate excellent crosstalk and sensitivity when substrate, guard and image wells were doped more highly and biased minimally. This configuration minimized each guard and image well depletion region (SCR) width, soSimulated backwall U/V blue illuminated double junction photodiode (DJPD) pixels demonstrate excellent crosstalk and sensitivity when substrate, guard and image wells were doped more highly and biased minimally. This configuration minimized each guard and image well depletion region (SCR) width, so that the image SCR could be presented as close as possible to the back wall without the guard and image SCRs overlapping between and within pixels. that the image SCR could be presented as close as possible to the back wall without the guard and image SCRs overlapping between and within pixels.
Keywords
CMOS integrated circuits; crosstalk; photodiodes; UV blue response; back illuminated deep double junction CMOS compatible photodiode pixel; crosstalk; high resolution pixel arrays; image well depletion region width; sensitivity; simulated backwall U/V blue illuminated double junction photodiode pixel; CMOS integrated circuits; Crosstalk; Image resolution; Junctions; Lighting; Sensitivity; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Optoelectronic and Microelectronic Materials & Devices (COMMAD), 2012 Conference on
Conference_Location
Melbourne, VIC
ISSN
1097-2137
Print_ISBN
978-1-4673-3047-3
Type
conf
DOI
10.1109/COMMAD.2012.6472435
Filename
6472435
Link To Document