• DocumentCode
    599922
  • Title

    Structural and optical properties of H implanted ZnO

  • Author

    Chan, Kheong Sann ; Ye, J.D. ; Parkinson, P. ; Monakhov, E. ; Johansen, K.M. ; Vines, L. ; Svensson, B.G. ; Jagadish, C. ; Wong-Leung, J.

  • Author_Institution
    Dept. of Electron. Mater. Eng., Australian Nat. Univ., Canberra, ACT, Australia
  • fYear
    2012
  • fDate
    12-14 Dec. 2012
  • Firstpage
    219
  • Lastpage
    220
  • Abstract
    ZnO is a wide bandgap semiconductor with huge potential to fabricate optoelectronic devices operating in the UV region. However, it is still not possible to achieve p-type ZnO, with hydrogen suggested to be a shallow donor that contributes significantly to the n-type conductivity in as grown ZnO. A better understanding on the role of H in ZnO is needed to realise p-type doping in ZnO. In this research, we utilised multiple structural and optical techniques to study the effects caused by H implantation in ZnO. The H implanted region in single crystal ZnO substrate was characterised by X-Ray diffraction, photoluminescence spectroscopy, secondary ion mass spectroscopy and transmission electron microscopy. XRD results show that H implantation created deformed layers with strain increasing linearly with implantation dose. A blue shift is also observed from the UV photoluminescence emission of the H implanted ZnO.
  • Keywords
    II-VI semiconductors; X-ray diffraction; ion implantation; photoluminescence; secondary ion mass spectroscopy; semiconductor doping; transmission electron microscopy; wide band gap semiconductors; zinc compounds; UV photoluminescence emission; UV region; X-ray diffraction; XRD; ZnO:H; blue shift; deformed layer; implantation dose; n-type conductivity; optical property; optical technique; optoelectronic device; p-type doping; photoluminescence spectroscopy; secondary ion mass spectroscopy; structural property; structural technique; transmission electron microscopy; wide bandgap semiconductor; Annealing; Doping; Hydrogen; Optical diffraction; Temperature measurement; X-ray scattering; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optoelectronic and Microelectronic Materials & Devices (COMMAD), 2012 Conference on
  • Conference_Location
    Melbourne, VIC
  • ISSN
    1097-2137
  • Print_ISBN
    978-1-4673-3047-3
  • Type

    conf

  • DOI
    10.1109/COMMAD.2012.6472439
  • Filename
    6472439