DocumentCode
600035
Title
Nanorobotic handling of few-layer graphene membranes using a combined AFM/SEM/FIB setup
Author
Zimmermann, S. ; Fatikow, Sergej
Author_Institution
Technol. Cluster Automated Nanohandling, OFFIS - Inst. for Inf. Technol., Oldenburg, Germany
fYear
2012
fDate
Aug. 29 2012-Sept. 1 2012
Firstpage
102
Lastpage
107
Abstract
This paper presents a new experimental approach for pick and place handling of few-layer graphene nanomembranes with side length of 10 μm and below. In the as-received condition, the membranes are freely suspended on a grid which is covered with a lacey carbon film. Using focused ion beam cutting and a nanorobotic driven tungsten tip, selected membrane-fragments can be separated from the grid and transferred to any chosen substrate with high accuracy. As an example, one membrane is placed on a hole with a diameter of 5 μm on a Si/SiO2 sample. Subsequently, the membrane is fixed and mechanically characterized. The paper investigates the advantages, the opportunities and the limits of this technique in particular with regard to possible applications.
Keywords
atomic force microscopy; cutting; focused ion beam technology; graphene; materials handling equipment; membranes; nanofabrication; robotic assembly; scanning electron microscopy; AFM-SEM-FIB setup; C; Si-SiO2; as-received condition; few-layer graphene membranes; focused ion beam cutting; lacey carbon film; mechanical characterization; membrane-fragments; nanorobotic driven tungsten tip; nanorobotic handling; pick and place handling; Biomembranes; Films; Graphene; Ion beams; Nanobioscience; Substrates; Tungsten; AFM based indentation; microscopic graphene transfer; nanorobotic assembly;
fLanguage
English
Publisher
ieee
Conference_Titel
Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2012 International Conference on
Conference_Location
Shaanxi
Print_ISBN
978-1-4673-4588-0
Electronic_ISBN
978-1-4673-4589-7
Type
conf
DOI
10.1109/3M-NANO.2012.6472934
Filename
6472934
Link To Document