Title :
Analysis of process variations´ impact on a 2.4 GHz 90 nm CMOS LNA
Author :
Gonzalez, Jose ; Cruz, J. ; Vazquez, David ; Rueda, Andrea
Author_Institution :
Centro de Investig. en Microelectron., CUJAE, Havana, Cuba
fDate :
Feb. 27 2013-March 1 2013
Abstract :
This work presents the analysis of a 90 nm CMOS LNA under process variations. The main parameters charactering the performance of this kind of devices are analyzed. It shows how the performance degradation is mainly derived from the resonant frequency shifting due to the output matching passive network. A way to partially compensate the degradation is presented. Preliminary results are shown.
Keywords :
CMOS analogue integrated circuits; UHF amplifiers; lattice networks; low noise amplifiers; CMOS LNA; frequency 2.4 GHz; output matching passive network; performance degradation; process variation impact; resonant frequency shifting; size 90 nm; CMOS integrated circuits; Degradation; Frequency measurement; Gain; Impedance matching; Noise; Noise measurement;
Conference_Titel :
Circuits and Systems (LASCAS), 2013 IEEE Fourth Latin American Symposium on
Conference_Location :
Cusco
Print_ISBN :
978-1-4673-4897-3
DOI :
10.1109/LASCAS.2013.6519087
