DocumentCode
601099
Title
Analysis of process variations´ impact on a 2.4 GHz 90 nm CMOS LNA
Author
Gonzalez, Jose ; Cruz, J. ; Vazquez, David ; Rueda, Andrea
Author_Institution
Centro de Investig. en Microelectron., CUJAE, Havana, Cuba
fYear
2013
fDate
Feb. 27 2013-March 1 2013
Firstpage
1
Lastpage
4
Abstract
This work presents the analysis of a 90 nm CMOS LNA under process variations. The main parameters charactering the performance of this kind of devices are analyzed. It shows how the performance degradation is mainly derived from the resonant frequency shifting due to the output matching passive network. A way to partially compensate the degradation is presented. Preliminary results are shown.
Keywords
CMOS analogue integrated circuits; UHF amplifiers; lattice networks; low noise amplifiers; CMOS LNA; frequency 2.4 GHz; output matching passive network; performance degradation; process variation impact; resonant frequency shifting; size 90 nm; CMOS integrated circuits; Degradation; Frequency measurement; Gain; Impedance matching; Noise; Noise measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (LASCAS), 2013 IEEE Fourth Latin American Symposium on
Conference_Location
Cusco
Print_ISBN
978-1-4673-4897-3
Type
conf
DOI
10.1109/LASCAS.2013.6519087
Filename
6519087
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