• DocumentCode
    60144
  • Title

    A Physically-Based Approach to Reflection Separation: From Physical Modeling to Constrained Optimization

  • Author

    Naejin Kong ; Yu-Wing Tai ; Shin, Joseph S.

  • Author_Institution
    Max-Planck-Inst. fur Intelligente Syst., Tubingen, Germany
  • Volume
    36
  • Issue
    2
  • fYear
    2014
  • fDate
    Feb. 2014
  • Firstpage
    209
  • Lastpage
    221
  • Abstract
    We propose a physically-based approach to separate reflection using multiple polarized images with a background scene captured behind glass. The input consists of three polarized images, each captured from the same view point but with a different polarizer angle separated by 45 degrees. The output is the high-quality separation of the reflection and background layers from each of the input images. A main technical challenge for this problem is that the mixing coefficient for the reflection and background layers depends on the angle of incidence and the orientation of the plane of incidence, which are spatially varying over the pixels of an image. Exploiting physical properties of polarization for a double-surfaced glass medium, we propose a multiscale scheme which automatically finds the optimal separation of the reflection and background layers. Through experiments, we demonstrate that our approach can generate superior results to those of previous methods.
  • Keywords
    image capture; image enhancement; image resolution; light polarisation; light reflection; natural scenes; optimisation; reflectivity; background layers; background scene; constrained optimization; double-surfaced glass medium; high-quality reflection separation; image pixels; incidence angle; mixing coefficient; multiscale scheme; optimal separation; physical modeling; physically-based approach; polarization; polarized images; polarizer angle; Ash; Cameras; Equations; Glass; Image edge detection; Image sensors; Mathematical model; Reflection separation; computational photography; image enhancement; polarized light;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2013.45
  • Filename
    6464269