Title :
1200 V SiC Schottky rectifiers optimized for ≥ 250 °C operation with low junction capacitance
Author :
Singh, Rajdeep ; Sundaresan, Siddarth
Author_Institution :
GeneSiC Semicond. Inc., Dulles, VA, USA
Abstract :
Electrical Characteristics of Industry´s first commercially available 1200 V rated SiC Schottky rectifiers, specially designed for operation at ≥250°C are presented. These high-temperature SiC rectifiers fabricated in 1, 5, and 20 A current ratings feature reverse leakage currents of <; 3 mA/cm2 at 1200 V up to temperatures as high as 300°C. GeneSiC´s 1200 V/20A High Temperature Schottky (designated SHT) rectifier offers a 10x reduction in leakage current and a 23% reduction in junction capacitance when compared to its nearest SiC Schottky rectifier competitor. In addition, these SHT rectifiers demonstrate superior surge-current ratings, and temperature-independent switching capability up to their rated junction temperatures.
Keywords :
Schottky diodes; high-temperature electronics; leakage currents; rectifiers; Schottky rectifier competitor; Schottky rectifiers; SiC; designated SHT rectifier; electrical characteristics; high temperature Schottky rectifier; low junction capacitance; rated junction temperatures; reverse leakage currents; surge-current ratings; temperature-independent switching capability; voltage 1200 V;
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2013 Twenty-Eighth Annual IEEE
Conference_Location :
Long Beach, CA
Print_ISBN :
978-1-4673-4354-1
Electronic_ISBN :
1048-2334
DOI :
10.1109/APEC.2013.6520213