• DocumentCode
    601570
  • Title

    Enhanced shielded-gate trench MOSFETs for high-frequency, high-efficiency computing power supply applications

  • Author

    Sarkar, Tamal ; Challa, A. ; Sapp, Steven

  • Author_Institution
    Device Design & Modeling, Fairchild Semicond., Pune, India
  • fYear
    2013
  • fDate
    17-21 March 2013
  • Firstpage
    507
  • Lastpage
    511
  • Abstract
    Shielded-gate trench-MOSFETs yield superior performance compared to conventional gate trench devices by allowing higher doping density in the drift region and providing a `shielding effect´ for the gate by placing an intermediate electrode between gate and drain. However, further design optimizations can be done for a shielded-gate trench-MOSFET to improve performance parameters particularly suited for next-generation high-frequency computing power supply applications and they have been outlined in this article. Channel length and threshold voltage optimization, substrate thinning and intrinsic gate resistance reduction (by layout enhancements) have been discussed along with their impact on device footprint reduction. Further, effects of these design optimizations on the power loss and efficiency of a high-frequency switching converter have been demonstrated through experimental characterizations.
  • Keywords
    MOSFET; isolation technology; power supply circuits; semiconductor doping; shielding; channel length; conventional gate trench devices; design optimizations; device footprint reduction; doping density; drift region; enhanced shielded-gate trench MOSFET; experimental characterizations; high-efficiency computing power supply applications; high-frequency switching converter; intrinsic gate resistance reduction; layout enhancements; next-generation high-frequency computing power supply applications; performance parameters; power loss; shielded-gate trench-MOSFET; shielding effect; substrate thinning; threshold voltage optimization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2013 Twenty-Eighth Annual IEEE
  • Conference_Location
    Long Beach, CA
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4673-4354-1
  • Electronic_ISBN
    1048-2334
  • Type

    conf

  • DOI
    10.1109/APEC.2013.6520257
  • Filename
    6520257