• DocumentCode
    601575
  • Title

    Modeling of SiC MOSFET with temperature dependent parameters and its applications

  • Author

    Juejing Lu ; Kai Sun ; Hongfei Wu ; Yang Xing ; Lipei Huang

  • Author_Institution
    Jiangsu Key Lab. of New Energy & Power Conversion, Nanjing Univ. of Aeronaut. & Astronaut., Nanjing, China
  • fYear
    2013
  • fDate
    17-21 March 2013
  • Firstpage
    540
  • Lastpage
    544
  • Abstract
    A model of Silicon carbide (SiC) MOSFET based on PSpice is proposed in this paper, which is suitable for a wide temperature range especially at low temperature. The static characteristics of SiC MOSFET are described by introducing temperature dependent voltage source and current source. The effect of negative turn-off gate drive voltage is also taken into account in the modeling. In order to reflect the low temperature characteristics of SiC MOSFET accurately, low temperature (-25°C) measurements are carried out, which provide the modeling basis. The determinations of key parameters in the model are analyzed in detail, including on-state resistor, internal gate resistor, temperature dependent sources, and some capacitors. The proposed model is verified by the experimental tests on a Buck converter prototype at different input voltages, input currents and temperatures. Simulation results on the proposed model coincide well with the experimental results, in terms of switching waveforms and power losses even at low temperature. The comparison between SiC MOSFET and Si MOSFET on switching characteristics and the efficiency comparison of Buck converter using SiC devices and Si devices are presented, which demonstrate the attractive advantage of SiC devices in power loss reduction.
  • Keywords
    MOSFET; SPICE; constant current sources; cryogenic electronics; power convertors; resistors; semiconductor device models; silicon compounds; wide band gap semiconductors; Buck converter prototype; PSpice; SiC; buck converter; current source; efficiency comparison; input currents; input voltages; internal gate resistor; low temperature characteristics; low temperature measurements; modeling basis; negative turn-off gate drive voltage; on-state resistor; power loss reduction; power losses; silicon carbide MOSFET; static characteristics; switching characteristics; switching waveforms; temperature dependent parameters; temperature dependent sources; temperature dependent voltage source; temperatures; wide temperature range;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2013 Twenty-Eighth Annual IEEE
  • Conference_Location
    Long Beach, CA
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4673-4354-1
  • Electronic_ISBN
    1048-2334
  • Type

    conf

  • DOI
    10.1109/APEC.2013.6520262
  • Filename
    6520262