• DocumentCode
    601756
  • Title

    High-temperature SOI-based gate driver IC for WBG power switches

  • Author

    Greenwell, R.L. ; McCue, Benjamin M. ; Tolbert, Leon M. ; Blalock, Benjamin J. ; Islam, Syed K.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Univ. of Tennessee, Knoxville, TN, USA
  • fYear
    2013
  • fDate
    17-21 March 2013
  • Firstpage
    1768
  • Lastpage
    1775
  • Abstract
    High-temperature integrated circuits fill a need in applications where there are obvious benefits to reduced thermal management or where circuitry is placed away from temperature extremes. Examples of these applications include aerospace, automotive, power generation, and well-logging. This work focuses on automotive applications in which the growing demand for hybrid electric vehicles (HEVs), Plug-in-hybrids (PHEVs), and Fuel-cell vehicles (FCVs) has increased the need for high-temperature electronics that can operate at the extreme ambient temperatures that exist under the hood of these vehicles, which can be in excess of 150°C. Silicon carbide (SiC) and other wide-bandgap power switches that can function at these temperature extremes are now entering the market. To take full advantage of their potential, high-temperature capable circuits that can also operate in these environments are required.
  • Keywords
    automotive electronics; driver circuits; fuel cell vehicles; high-temperature electronics; hybrid electric vehicles; silicon compounds; silicon-on-insulator; switches; FCV; HEV; PHEV; SiC; WBG power switches; aerospace applications; automotive applications; fuel-cell vehicles; high-temperature SOI-based gate driver IC; high-temperature capable circuits; high-temperature electronics; high-temperature integrated circuits; hybrid electric vehicles; plug-in-hybrids; power generation; temperature 150 degC; temperature extremes; thermal management; well-logging; wide-bandgap power switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2013 Twenty-Eighth Annual IEEE
  • Conference_Location
    Long Beach, CA
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4673-4354-1
  • Electronic_ISBN
    1048-2334
  • Type

    conf

  • DOI
    10.1109/APEC.2013.6520535
  • Filename
    6520535