• DocumentCode
    601879
  • Title

    DC power network post-fault recharging with an H-bridge cascaded multilevel converter

  • Author

    Chao Chen ; Adam, Grain Philip ; Finney, Stephen J. ; Williams, Barry W.

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Univ. of Strathclyde, Glasgow, UK
  • fYear
    2013
  • fDate
    17-21 March 2013
  • Firstpage
    2569
  • Lastpage
    2574
  • Abstract
    This paper proposes an algorithm for controlled recharge (from the ac side) of the dc link capacitors of a H-bridge cascaded multilevel converter, while ensuring that the voltages across H-bridge cell capacitors remain balanced and tightly within their operating limits. The proposed recharging scheme potentially eliminates any external circuitry needed to start and shutdown the dc grid, and restart following a dc fault. Therefore, it may facilitate HVDC network fast recovery from the DC side faults, with minimal impact on the ac side and risk of power converter failure due to current surge or voltage sag. In addition, this paper presents mathematical analysis that can be used in the development and understanding of DC link capacitor charging and its associated effects. Simulations from detailed switch and average models of the H-bridge cascaded converter are used to validate the proposed charging and discharging algorithm.
  • Keywords
    HVDC power transmission; bridge circuits; fault diagnosis; mathematical analysis; power capacitors; power convertors; power supply quality; surges; AC side; DC grid shutdown; DC link capacitors; DC power network post-fault recharge; DC side faults; H-bridge cascaded converter; H-bridge cascaded multilevel converter; H-bridge cell capacitors; HVDC network fast recovery; current surge; discharging algorithm; external circuitry; mathematical analysis; power converter failure risk; recharge control; voltage sag;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2013 Twenty-Eighth Annual IEEE
  • Conference_Location
    Long Beach, CA
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4673-4354-1
  • Electronic_ISBN
    1048-2334
  • Type

    conf

  • DOI
    10.1109/APEC.2013.6520658
  • Filename
    6520658