DocumentCode :
601896
Title :
Stability and robustness analysis of d/dt-closed-loop IGBT gate drive
Author :
Lobsiger, Yanick ; Kolar, Johann Walter
Author_Institution :
Power Electron. Syst. Lab., ETH Zurich, Zurich, Switzerland
fYear :
2013
fDate :
17-21 March 2013
Firstpage :
2682
Lastpage :
2689
Abstract :
Closed-loop IGBT switching trajectory control by means of an active IGBT gate drive (AGD) ensures an operation of the IGBT in the SOA and enables the minimization of switching delays, switching losses and EMI. In this paper the closed-loop control of diC/dt and dvCE/dt by the use of an AGD is investigated on the basis of control-oriented small signal IGBT modeling and the analysis of IGBT module parasitics. Therewith, analytical stability considerations are carried out employing root-locus plots. Furthermore, the transfer functions for different closed-loop controlled IGBT modules are analyzed in dependency of their parameter variations and parasitic inductances. A closed-loop AGD prototype is used to experimentally test, verify and comparatively evaluate the switching behavior of the different considered IGBT modules.
Keywords :
circuit stability; closed loop systems; driver circuits; electromagnetic interference; insulated gate bipolar transistors; transfer functions; IGBT module parasitics; closed-loop IGBT gate drive; closed-loop IGBT switching trajectory control; closed-loop control; electromagnetic interference; parameter variations; parasitic inductances; robustness analysis; root-locus plots; small signal IGBT modeling; stability analysis; switching delays; switching losses; transfer functions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2013 Twenty-Eighth Annual IEEE
Conference_Location :
Long Beach, CA
ISSN :
1048-2334
Print_ISBN :
978-1-4673-4354-1
Electronic_ISBN :
1048-2334
Type :
conf
DOI :
10.1109/APEC.2013.6520675
Filename :
6520675
Link To Document :
بازگشت