• DocumentCode
    601902
  • Title

    Confidence analysis on identification results of three-phase voltage source inverters d-q impedance from transient response to load steps

  • Author

    Valdivia, Virgilio ; Mattavelli, Paolo ; Wen, Bo ; Jaksic, M. ; Lazaro, Antonio ; Barrado, A.

  • Author_Institution
    Electron. Technol. Dept., Power Electron. Syst. Group, Carlos III Univ. of Madrid, Leganes, Spain
  • fYear
    2013
  • fDate
    17-21 March 2013
  • Firstpage
    2726
  • Lastpage
    2733
  • Abstract
    Stability assessment of three-phase AC distributed power systems can be carried out using d-q impedance and admittance models of the load and source subsystems. To do so, an impedance identification technique of three-phase voltage source inverters, based on the transient response to reactive and active power steps, have been recently reported. However, in the reported work, no method to evaluate the accuracy of the identification results, in frequency domain, has been described. In this paper, a method to determine the bandwidth where the model can be confidently identified, as well as the identification accuracy within such a bandwidth, is proposed. This method is based on a spectral analysis of the transient waveforms. It is illustrated and discussed using a simulation case study.
  • Keywords
    distributed power generation; electric admittance; electric impedance; invertors; load (electric); power system identification; power system stability; reactive power; spectral analysis; transient response; waveform analysis; active power; admittance models; bandwidth determination method; confidence analysis; d-q impedance identification results; identification results accuracy evaluation; load subsystems; reactive power; source subsystems; spectral analysis; three-phase AC distributed power system stability assessment; three-phase voltage source inverters; transient response; transient waveforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2013 Twenty-Eighth Annual IEEE
  • Conference_Location
    Long Beach, CA
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4673-4354-1
  • Electronic_ISBN
    1048-2334
  • Type

    conf

  • DOI
    10.1109/APEC.2013.6520681
  • Filename
    6520681