EIS algorithm based on single-cell impedance system

Author

Sung-Lin Tsai ; Ming-Kun Chen ; Min-Haw Wang ; Ling-Sheng Jang

Author_Institution

Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan

fYear

2013

fDate

12-16 March 2013

Firstpage

115

Lastpage

118

Abstract

This work presents an electrical impedance spectroscopy (EIS) impedance analysis system for a single HeLa cell measurement in the frequency range of 11 to 101 kHz. The system includes a micro-controller-unit (MCU) using 8051F320 chip, an impedance analyzer using AD5934 chip, a function generation circuit and a biochip utilizing electric trapping method in a compact device. The biochip utilizes the alternating currrent electrothermal (ACET) and electrophoresis (DEP) phenomenon to capture a single cell, which is based on micro-electro-mechanical-system (MEMS). A single cell capture in the system is demonstrated as well as the conventional equipment. The electrical characterization of the measured environment is modeling to calculate the significant cell impedance.

Keywords

bioMEMS; bioelectric phenomena; cellular biophysics; electrochemical impedance spectroscopy; electrophoresis; microcontrollers; microfluidics; 8051F320 chip; ACET phenomenon; AD5934 chip; DEP phenomenon; EIS algorithm; EIS impedance analysis system; MCU; MEMS; alternating currrent electrothermal phenomenon; biochip; dielectrophoresis phenomenon; electric trapping method; electrical impedance spectroscopy; function generation circuit; impedance analyzer; microcontroller unit; microelectromechanical system; single HeLa cell measurement; single cell capture; single cell impedance system; Capacitors; Educational institutions; Electric fields; Electrodes; Impedance; Impedance measurement; Resistors; Alternating currrent electrothermal (ACET); electrical impedance spectroscopy (EIS); electrophoresis (DEP); micro-controller-unit (MCU); micro-electro-mechanical-system (MEMS); single cell;

fLanguage

English

Publisher

ieee

Conference_Titel

Orange Technologies (ICOT), 2013 International Conference on

Conference_Location

Tainan

Print_ISBN

978-1-4673-5934-4

Type

conf

DOI

10.1109/ICOT.2013.6521171

Filename

6521171