• DocumentCode
    602341
  • Title

    An investigation on Cu wire bond corrosion and mitigation technique for automotive reliability

  • Author

    Tai, C.T. ; Lim, H.Y. ; Teo, C.H. ; Audrey Swee, P.J.

  • Author_Institution
    Logic Products Development, Infineon Technologies (Advanced Logic) Sdn. Bhd., Batu Berendam, Melaka 73500, Malaysia
  • fYear
    2012
  • fDate
    6-8 Nov. 2012
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    The increase of gold price had pushed industrial to develop copper wire in order to stay competitive. However, copper is not precious material like gold, there are numerous challenges in bonding & reliability risk associated with stringent automotive reliability requirements. Corrosion associated with copper wire bonding is considered one of the hard to solve reliability risk as the occurrence is in very low ppm and there was no specific pattern observed on the corroded bondpad location. This paper is focusing on the copper wire interconnect with Aluminum pad corrosion in humidity test including autoclave and temperature humidity bias test.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium (IEMT), 2012 35th IEEE/CPMT International
  • Conference_Location
    Ipoh, Perak, Malaysia
  • ISSN
    1089-8190
  • Print_ISBN
    978-1-4673-4384-8
  • Electronic_ISBN
    1089-8190
  • Type

    conf

  • DOI
    10.1109/IEMT.2012.6521745
  • Filename
    6521745