DocumentCode :
602341
Title :
An investigation on Cu wire bond corrosion and mitigation technique for automotive reliability
Author :
Tai, C.T. ; Lim, H.Y. ; Teo, C.H. ; Audrey Swee, P.J.
Author_Institution :
Logic Products Development, Infineon Technologies (Advanced Logic) Sdn. Bhd., Batu Berendam, Melaka 73500, Malaysia
fYear :
2012
fDate :
6-8 Nov. 2012
Firstpage :
1
Lastpage :
10
Abstract :
The increase of gold price had pushed industrial to develop copper wire in order to stay competitive. However, copper is not precious material like gold, there are numerous challenges in bonding & reliability risk associated with stringent automotive reliability requirements. Corrosion associated with copper wire bonding is considered one of the hard to solve reliability risk as the occurrence is in very low ppm and there was no specific pattern observed on the corroded bondpad location. This paper is focusing on the copper wire interconnect with Aluminum pad corrosion in humidity test including autoclave and temperature humidity bias test.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium (IEMT), 2012 35th IEEE/CPMT International
Conference_Location :
Ipoh, Perak, Malaysia
ISSN :
1089-8190
Print_ISBN :
978-1-4673-4384-8
Electronic_ISBN :
1089-8190
Type :
conf
DOI :
10.1109/IEMT.2012.6521745
Filename :
6521745
Link To Document :
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